Anritsu's Latest Test Set Features High-speed Radio Layer Measurement for WLAN Chipsets

(Product News, 12 Jun 2008)

Anritsu Co. has launched the MT8860C WLAN Test Set, a fully integrated test solution that performs high-speed radio layer measurements on IEEE 802.11 WLAN chip sets. The MT8860C combines the capabilities of a power meter, spectrum analyzer, and vector signal generator to provide designers and manufacturers with a single instrument that performs traceable and repeatable measurements on WLAN devices to ensure they are in full compliance with the IEEE 802.11-2007 standard.

One of the unique features of the MT8860C, the Network mode capability, uses standard WLAN protocol messaging to test both the transmitter and receiver of a device under test (DUT), and eliminates the need for control software from the chipset vendor. Network mode greatly simplifies the measurement set-up and allows any WLAN device to be tested in a mode that closely reflects its native operation. This is especially important when testing the new generation of portable consumer products, such as digital cameras, smart phones and PDAs, where the WLAN technology is embedded inside the end product.

The MT8860C also supports Direct mode capability. In this mode, the MT8860C automatically creates and transmits WLAN packets to test the receiver of a DUT, and measures the transmitter via a built-in transmitter analyzer. Control software supplied by the chipset vendor is used to configure the DUT via a host processor interface, such as USB.

To further enhance the MT8860C in volume production environments, Anritsu has developed LANTest software with DUT control packages. The control packages have been designed in partnership with leading WLAN chipset vendors to provide a fully automated PC application for rapid testing of WLAN devices without manual intervention.

The MT8860C provides significant advantages over existing multi-instrument test configurations. The integrated test set design of the MT8860C eliminates the need to calibrate the interconnections between numerous test instruments and the internal reference radio does not suffer the drift and variability of external gold radios. This combination provides a more stable test system that results in a better quality of consumer product shipped.

Measurement test times are also significantly reduced because of the MT8860C¡¯s integrated spectral processor. Tests, such as peak and average power, spectral mask compliance, spectral flatness and EVM are measured in parallel and displayed in typically 500ms.

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