Credence's ATE Platform Tests Ralink's WLAN Chipset Solution

(Product News, 10 Jun 2008)

WLAN chipset provider Ralink Technology Corp. has selected the Diamond 40RF (D40 RF) platform from Credence Systems Corp. to test its 802.11n single-chip solutions for Wi-Fi communications. Credence is a provider of test solutions for the worldwide consumer semiconductor industry.

Ralink has selected the D40 RF for production testing of its newest devices, the RT3070, said to be the industry's smallest 802.11n USB single chip as client devices and other 11n single-chip solutions. The RT3070 is highly integrated and cost-effective for small form factor and low power applications. In an 8x8mm QFN package, this chip solution benefits from the capability of the D40 RF to meet requirements for RF and digital testing as well as massive multi-site testing. Ralink will also utilize the D40 RF to test monolithically integrated RF transmitters, receivers, systems-on-chip (SoC), and 10/100Mbps Ethernet physical layer interfaces. Additionally, Ralink expects to drive numerous Diamond 40RF systems with their outsource assembly and test (OSAT) partners in Taiwan, benefiting from the platform's ability to deliver tremendous throughput with a high degree of parallelism for production efficiency and lowest overall cost of production test.

The Diamond 40RF test system combines analog, digital, mixed signal, and RF test instrumentation to support a wide range of consumer IC device test. Incorporating Credence's patented MVNA (Modulated Vector Network Analysis) technology, the D40 RF adds wireless test capabilities for mobile phone, WLAN, WiMAX and ZigBee devices. Offering from 10 to up to 40 slots, the D40 RF supports over 3000 pins for very large ASIC testing, or massive multi-site test requirements (>16 sites) in a modular system architecture that allows the tester infrastructure to grow as the number of sites expands, maintaining test economics. The D40 RF can expand in 10 slot increments ensuring a match of system capability to various test requirements.

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