Cascade Microtech Launches Fully Integrated Flicker Noise Measurement System

(Product News, 30 May 2008)

Cascade Microtech has launched the EDGE Flicker Noise Measurement System, said to be the only flicker noise measurement system that is certified to provide accurate measurements from 1Hz to 30MHz, and is the industry's only fully integrated measurement system. In contrast to traditional flicker noise measurement solutions, which are bolted-together systems comprising system elements from up to five different vendors, the EDGE Flicker Noise Measurement System is a true turn-key solution. Seamless integration of the wafer probe station, instruments, software and accessories is overlaid with unprecedented service and support in the form of site surveys, pre- and post-measurement optimization and continuing application support. The result is a worry-free, accurate flicker noise measurement.

The EDGE Flicker Noise Measurement System provides simple access to flicker noise data over the widest frequency range with the lowest background noise, typically less than 1.2nV/rtHz at 100kHz and above. This wide frequency range and low background noise allows customers to increase device performance, command higher margins and reduce time to market.

Because it is fully integrated, the EDGE Flicker Noise Measurement System eliminates the need for custom fixturing or instrumentation. In addition, it has been designed to switch between flicker and DC measurements with push-button automation, providing both sets of measurements, over-temperature, in one system. This eliminates risky transfer of the wafer from one measurement station to another, and removes the risk of error associated with reconfiguring bolted-together solutions to change their functionality.

Click here for more information on Cascade Microtech's EDGE Integrated Flicker Noise Measurement System

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