Keithley Wireless Test System Selected as Finalist in EDN Magazine Innovation Award Competition

(Business News & Technology News, 1 Apr 2008)

Keithley Instruments Inc. has been named a finalist in EDN Magazine's 18th Annual Innovation Awards Competition in the General Purpose Test and Measurement category for its 4X4 MIMO (multiple-input, multiple-output) RF Test System. EDN's Innovation Awards Competition recognizes and honors the people, products, and technologies that have shaped the semiconductor industry over the past year. The finalists are selected by engineers and engineering managers around the world by voting online at www.edn.com/innovation18 for the best product in each of 21 categories. Winners will be announced at a dinner and awards ceremony on April 14, 2008 in San Jose, CA.

Designed for R&D and production testing of next-generation RF communications equipment and devices, Keithley's 4X4 MIMO RF test system allows engineers to take high-performance measurements on demanding signals for next-generation mobile communication devices, including the kind of systems envisioned for city-wide wireless access. The 4X4 MIMO RF test system consists of the new Model 2920 RF Vector Signal Generator (VSG), Model 2820 RF Vector Signal Analyzer (VSA), Model 2895 MIMO Synchronization Unit, and powerful MIMO Signal Analysis Software.

Keithley's 4X4 MIMO RF test systems are ideal for R&D engineers and scientists at WLAN and WiMAX design centers and R&D centers. In addition, test engineers involved with 3GPP cell phone production and RF power amplifier manufacturing, as well as W-CDMA base stations and other wireless connectivity solutions in defense and aerospace applications, can also take advantage of the speed, accuracy, and flexibility that these powerful test systems offer.

Click here for more information on Keithley's 4X4 MIMO RF Test Systems

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