Jitter Test System

( 1 Nov 2007 )

The Wireless Telecom Group Company announces the release of the Noise Com J7000 Jitter Test System. The Test System is a powerful test instrument designed to alter serial signal streams through injection of Gaussian noise in a way that reflects real world signal behavior.

To evaluate performance of components and systems, the J7000 is capable of adding precise amounts of white noise to the signal stream that allows the measurement of Signal-to-Noise ratio (SNR), Carrier-to-Noise ratio (CNR) and Bit-Error-Rate (BER). J7000 systems are available in different frequency bands ranging from 1MHz up to 5GHz. A very high Crest Factor of greater than 18dB guarantees optimal distribution of random events to evaluate low BER.

The J7000 series provides a frequency dependent output power that ranges from -131dBm/-66dBm to -3dBm and provides an ultra-low distortion signal path.

Noise Com Inc.; www.noisecom.com