Click to navigate back to homepage  
Thursday, March 18, 2010 
  Search :



 
 
     
 
 
Issue > Nov 2009 > Emerging Technologies and Markets
 
 

One-Button Test for 10GBASE-T Accelerates Validation Cycles

( 1 Nov 2009 )


The XGbT automation solution from Tektronix Inc. is the “first” one-button solution for the full-range of 10GBASE-T measurements. The oscilloscope-based solution lowers cost by nearly 50 percent, removes complexity, and improves usability compared to competitive 10GBASE-T test solutions that require the use of up to three separate instruments.

Using the solution, 10GBASE-T designers and validation engineers can improve efficiency with faster validation cycles and higher reliability. The software is built on the TekExpress test automation framework which enables additional automation steps that may be required for unique measurement needs. Compared to competitive offerings which require the use of an oscilloscope, vector network analyzer (VNA) and spectrum analyzer, the solution provides faster and easier test setup. The use of a single instrument reduces upfront costs by nearly 50 percent in certain configurations and provides for a significantly improved user experience and more repeatable results. This is especially important in distributed engineering environments where repeatable test methods are required across different groups using different test equipment. It conforms to 10GBASE-T PHY electrical testing specifications.

The solution allows customers to use all four channels of the DPO/DSA oscilloscope to perform measurements for faster test times and additional cost savings. Customers can also use the P7380 SMA differential probe and P6330 high input impedance probe with the XGbT test fixture to further reduce test time. For in-depth validation and debugging, the XGbT software includes a reporting module and results export capabilities, and can capture test margins and statistical information.

 
 
 
 
Related Articles
   

Anritsu Intros First Bluetooth Low Energy Test Solution

Anritsu Intros Microwave USB Power Sensor with Coverage Up to 26GHz

Aeroflex Launches Complete Solution for RF Parametric Test of Wireless Subsystems, including LTE

Aeroflex Launches Complete Solution for RF Parametric Test of Wireless Subsystems, Including LTE

Tektronix Communications Announces Network Intelligence Products for Enhanced Performance Monitoring of Next Generation IP Networks

Flying Prober for Reverse Engineering

Conformance Testing of LTE User Equipment

Test Software Accelerates ZigBee Time-to-market

Tektronix Adds MIPI Support to DPO7000 Series Oscilloscopes

Aeroflex Improves Test Times of RF Communications Devices

   
 
Top News
   

Verizon’s $17 Billion Network Investment in 2009 Pays Off

Anritsu Intros First Bluetooth Low Energy Test Solution

Nokia, ST-Ericsson to Partner on TD-SCDMA

Xilinx Connectivity, Embedded, and DSP Kits Enable Increased Productivity, Innovation for SoC Designs

Motorola Leads Fast-rebounding WiMAX Equipment and Device Market

   
 
 
 
 
Industry Links
Photonics Association (Singapore)
Singapore Industrial Automation Association (SIAA)
Taiwan Semiconductor Industry Association (TSIA)
   
   
 
 
 
 
 


 
 
Technical Channels

Amplifiers

Components

Digital Hardware/components

Integrated components

Integrated subsystems

Interface/interconect

Materials

Passives

Power

Semis/ICs/Mmics

Services

Signal Processing

Signal Sources

Software

Test & Measurement

Transmission Components

Wireless Protocols

 
Other Websites
EDN Asia
EDN Asia (India)
EDN Asia (Taiwan)
EDN Asia (Korea)
ECN Asia
ECN Asia (Korea)
ECN Asia (Taiwan)
  ECN Asia (China)
  EB Asia
Electronics Asia
Reed Electronic Group
Reed Business Information Asia
   
 

© 2010 Reed Business Information, a division of Reed Elsevier Inc.
All rights reserved. Use of this web site is subject to its Terms and Conditions of Use. View our Privacy Policy.